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The applicable Test Definition identifies each emulation characteristic subject to fidelity validation.
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Each specified fidelity criterion has a unique identity.
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The Test Definition identifies the purpose and significance of each fidelity criterion.
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The Test Definition specifies the expected value, condition, state, sequence, distribution, or behaviour associated with each criterion.
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The Test Definition specifies the applicable tolerance, range, resolution, precision, accuracy, duration, frequency, or timing limit for each criterion.
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The Test Definition identifies the measurement or observation method used to assess each criterion.
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The Test Definition identifies the observation points, data sources, sampling conditions, units, and comparison methods required for fidelity validation.
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The Test Definition identifies the fidelity criteria that must be satisfied before Test Execution begins.
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The Test Definition identifies the fidelity criteria that must remain satisfied during Test Execution.
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The Test Definition identifies the fidelity criteria assessed after Test Execution.
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The DIDO-TE validates the initial emulated topology, participating Nodes, communication paths, configurations, and resource conditions before beginning the applicable Test Execution.
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The DIDO-TE validates communication behaviour, timing, synchronisation, resource conditions, failures, partitions, membership changes, topology changes, and recovery behaviour, as applicable.
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The DIDO-TE compares each specified fidelity criterion with measured or observed values recorded during Test Execution.
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The DIDO-TE accounts for measurement accuracy, resolution, uncertainty, sampling limitations, clock error, and observation interference when evaluating fidelity.
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The DIDO-TE determines whether each measured or observed value falls within its specified tolerance or acceptance range.
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The DIDO-TE validates the sequence, activation time, duration, scope, and termination of each specified emulation event.
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The DIDO-TE validates the relationships among emulated conditions when the Test Definition specifies combined or dependent fidelity criteria.
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The DIDO-TE identifies each fidelity criterion that cannot be evaluated because of missing, incomplete, inaccurate, conflicting, or unavailable data.
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The DIDO-TE does not treat an unevaluated mandatory fidelity criterion as satisfied.
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The DIDO-TE identifies each condition that remained outside its specified fidelity tolerance.
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The DIDO-TE identifies the start time, end time, duration, magnitude, scope, and affected elements associated with each fidelity deviation.
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The DIDO-TE determines whether each fidelity deviation invalidates the Test Execution, limits the interpretation of a Test Result, or remains within a permitted exception.
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The DIDO-TE distinguishes an emulation-fidelity deviation from a failure or nonconformance of the Test Object.
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The DIDO-TE identifies any operator intervention or environmental event that affects emulation fidelity.
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The DIDO-TE produces an overall emulation-fidelity determination for the Test Execution.
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The DIDO-TE records the applicable criteria, expected values, measured or observed values, tolerances, comparison methods, uncertainties, deviations, exceptions, and determinations as
Evidence.
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The DIDO-TE maintains
Traceability among each fidelity criterion, emulated condition, recorded value, comparison, deviation, Test Definition, Test Execution, Evidence, and Test Result.
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An unvalidated, unsatisfied, unsupported, incorrectly assessed, or untraceable mandatory fidelity criterion constitutes nonconformance with this requirement.
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Inspection of the fidelity criteria specified by the applicable Test Definition
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Inspection of expected values, tolerances, ranges, resolutions, accuracies, timing limits, and acceptance criteria
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Inspection of the measurement methods, observation points, data sources, units, sampling conditions, and comparison methods
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Comparison of specified and recorded topology, Node membership, communication behaviour, timing, resource conditions, failures, partitions, changes, and recovery behaviour
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Confirmation that required pre-execution fidelity criteria are satisfied before Test Execution begins
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Confirmation that required runtime fidelity criteria remain within their specified tolerances
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Confirmation that required post-execution fidelity criteria are assessed
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Testing of a value at, within, and outside a specified fidelity tolerance
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Testing of an emulation event that starts late, ends early, exceeds its scope, or produces an incorrect condition
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A negative assessment involving missing, inaccurate, conflicting, or unavailable fidelity data
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Confirmation that an unevaluated mandatory fidelity criterion does not receive a satisfied determination
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Confirmation that measurement uncertainty and observation interference are included in the fidelity determination
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Confirmation that the DIDO-TE distinguishes an emulation-fidelity deviation from Test Object behaviour
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Confirmation that each fidelity deviation identifies its duration, magnitude, scope, and effect on the Test Result
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Inspection of the overall emulation-fidelity determination, supporting Evidence, and Traceability records
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Confirmation that each mandatory fidelity deviation produces a nonconformance result